Awards ceremony of 31st Kanagawa Industrial Technical Grand Award was held on 7th November, 2014, and Japan Probe Co., Ltd. received an “Award for encouragement” from Mr. Yuji Kuroiwa, Kanagawa prefectural governor.
KITG Award was established in the 1984 in order to commend the technologies and products which are developed by medium-sized/small and medium-sized enterprises in Kanagawa and are expected to contribute to the society.
2 “Grand Award”, 2 “Business Award” and 3 “Award for encouragement” were elected in this year.
Japan Probe Co., Ltd. received an “Award for encouragement” by “BFAP” as “Ultrasonic array probe for defect inspection of main wings of an airplane”.
Following is the reason of the award. (Quote from data of the prize)
“The industrialized point of awarded technology/product”
Conventional ultrasonic array probe is unfit to inspect internal defects of curved surface structure, but Japan Probe Co, Ltd succeed to develop the technology that is possible to inspect internal defects of curved surface structure like a main wings of an airplane. We value the point that this technology can be expected to develop it to other fields, especially medical one.
Yukio Ogura, President of Japan Probe Co., Ltd. and Mr. Yuji Kuroiwa, Kanagawa prefectural governor
Photo courtesy of Kanagawa Prefecture